Your search returned 8 results.

Not what you expected? Check for suggestions

Image from Google Jackets

Design for at-speed test, diagnosis, and measurement [electronic resource] / edited by Benoit Nadeau-Dostie. by

Series: Frontiers in electronic testing

Material type:

Text; Format: electronic available online remote

; Literary form: Not fiction

Publication details: Boston : Kluwer Academic, c2000

Online resources:

An electronic book accessible through the World Wide Web; click to view

Availability: Items available for reference: Meru University: Not for loan (1).

Image from Google Jackets

A designer's guide to built-in self-test [electronic resource] / Charles E. Stroud. by

Series: Frontiers in electronic testing

Material type:

Text; Format: electronic available online remote

; Literary form: Not fiction

Publication details: Boston : Kluwer Academic Publishers, c2002

Online resources:

An electronic book accessible through the World Wide Web; click to view

Availability: Items available for reference: Meru University: Not for loan (1).

Image from Google Jackets

Essentials of electronic testing for digital, memory, and mixed signal VLSI circuits [electronic resource] / Michael L. Bushnell, Vishwani D. Agrawal. by

Series: Frontiers in electronic testing ; 17.

Material type:

Text; Format: electronic available online remote

; Literary form: Not fiction ; Audience: General;

Publication details: New York : Kluwer Academic, c2002

Online resources:

An electronic book accessible through the World Wide Web; click to view

Availability: Items available for reference: Meru University: Not for loan (1).

Image from Google Jackets

Power-constrained testing of VLSI circuits [electronic resource] / by Nicola Nicolici and Bashir M. Al-Hashimi. by

Series: Frontiers in electronic testing ; 22.

Material type:

Text; Format: electronic available online remote

; Literary form: Not fiction

Publication details: Boston : Kluwer Academic Publishers, c2003

Online resources:

An electronic book accessible through the World Wide Web; click to view

Availability: Items available for reference: Meru University: Not for loan (1).

Image from Google Jackets

High performance memory testing [electronic resource] : design principles, fault modeling, and self-test / R. Dean Adams. by

Series: Frontiers in electronic testing

Material type:

Text; Format: electronic available online remote

; Literary form: Not fiction

Publication details: Boston : Kluwer Academic, c2003

Online resources:

An electronic book accessible through the World Wide Web; click to view

Availability: Items available for reference: Meru University: Not for loan (1).

Image from Google Jackets

Boundary-scan interconnect diagnosis [electronic resource] / Josâe T. de Sousa, Peter Y.K. Cheung. by

Series: Frontiers in electronic testing ; 18.

Material type:

Text; Format: electronic available online remote

; Literary form: Not fiction

Publication details: Boston : Kluwer Academic Publishers, c2001

Online resources:

An electronic book accessible through the World Wide Web; click to view

Availability: Items available for reference: Meru University: Not for loan (1).

Image from Google Jackets

Fault injection techniques and tools for embedded systems reliability evaluation [electronic resource] / edited by Alfredo Benso and Paolo Prinetto. by

Series: Frontiers in electronic testing ; 23.

Material type:

Text; Format: electronic available online remote

; Literary form: Not fiction

Publication details: Boston : Kluwer Academic Publishers, c2003

Online resources:

An electronic book accessible through the World Wide Web; click to view

Availability: Items available for reference: Meru University: Not for loan (1).

Image from Google Jackets

Verification by error modeling [electronic resource] : using testing techniques in hardware verification / written by Katarzyna Radecka, Zeljko Zilic. by

Series: Frontiers in electronic testing ; 25.

Material type:

Text; Format: electronic available online remote

; Literary form: Not fiction

Publication details: Boston : Kluwer Academic Publishers, 2003

Online resources:

An electronic book accessible through the World Wide Web; click to view

Availability: Items available for reference: Meru University: Not for loan (1).

Not finding what you're looking for?

Make a purchase suggestion

Refine your search

Availability

Authors

Item types

Locations

Series

Topics

Your search returned 8 results.

Refine your search

Availability

Authors

Item types

Locations

Series

Topics

Your search returned 8 results.

Public lists