"This book focuses on explaining and applying the principles of machine learning-based techniques and advanced image processing methods currently used in the electron microscopy community suitable for handling large electron microscopy data sets and extracting structure-property information for various materials. It explains and exemplifies how to use these methods in order to interpret STEM images and extract suitable information in order to reveal material properties at the nanoscale"-- Provided by publisher.

OCLC-licensed vendor bibliographic record.