TY  - BOOK
AU  - Chrzanowska-Jeske,Malgorzata
AU  - Weide-Zaage,Kirsten
TI  - Semiconductor devices in harsh conditions
T2  - Devices, circuits, and systems
SN  - 9781315368948
AV  - TK7871.85 .S449 2017
U1  - 621.38152 
PY  - 2017///]
CY  - Boca Raton
PB  - CRC Press
KW  - Semiconductors
KW  - Reliability
KW  - Extreme environments
KW  - Environmental testing
N1  - section I. Radiation -- section II. Sensors and operating conditions -- section III. Packaging and system design
UR  - https://www.taylorfrancis.com/books/9781315368948
ER  -